Monitoring for weld expulsion: A prime cause of weak welds, defects
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ON-DEMAND: Leak test data 101 - Tips on analyzing leak test data for process optimization
Technical Writer: India
Sciemetric is looking for a Technical Writer to be based out of our Pune office. The Technical Writer is responsible for producing product documentation that enhances the user experience. Learn more.
NVH Testing Part 2: Ensuring smooth cruising for wheelchair drive motors
John Perkins recaps a use case for noise, vibration and harshness (NVH) testing. A multi-channel sigPOD platform with a strategically located accelerometer helped a wheelchair manufacturer catch problems with motors and gearboxes during production to avoid warranty claims.
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Sciemetric Studio 2.0 brings a new level of intelligence to the factory floor
Sciemetric is pleased to release Sciemetric Studio 2.0, giving manufacturers greater insights from more sources of data to proactively manage their production lines. New features include enabling the use of Nelson rules for statistical process control (SPC), and real-time alerts. Read the press release for more details.
Tags:Driving quality, traceability for medical device batch manufacturing
In process testing and digital waveform analysis isn’t only for discrete manufacturing where each part is serialized. Ron Pawulski explores how it can also be used to improve yield and quality control in pharmaceutical and medical device batch manufacturing.
Skip the sound room: How to keep noise/vibration testing on the line
John Perkins discusses how an ICP-based accelerometer that’s connected to a test monitoring system can keep noise, vibration and harshness (NVH) testing on the factory floor and avoid the cost and complexity of having to use an anechoic chamber.
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The Repair Bay, Part 3: A day in the life
Concluding our three-part series, Patrick Chabot looks at how individuals from the plant floor to the office engage with and benefit from a repair bay data analytics system that’s integrated with the rest of the data collection and analysis from the production line.
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